Free Access
Microsc. Microanal. Microstruct.
Volume 1, Number 3, June 1990
Page(s) 233 - 240
Microsc. Microanal. Microstruct. 1, 233-240 (1990)
DOI: 10.1051/mmm:0199000103023300

Development of a 300 kV ultrahigh resolution analytical electron microscope

Yoshihiro Arai1, Kurio Fukushima1, Yasushi Kokubo1 et Alain Michot2

1  JEOL Ltd., 1-2 Musashino 3-chome Akishima Tokyo 196, Japan
2  JEOL S.A., 16, Avenue de Colmar, 92500 Rueil-Malmaison, France

Without abstract

0778 - Electron, positron, and ion microscopes; electron diffractometers.

Key words
Analytical electron microscopy -- High-resolution methods -- Instrumentation -- Optical lens -- Goniometers -- Vacuum systems

© EDP Sciences 1990

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.

First page of the article