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Microscopy Microanalysis Microstructures

Vol. 8 No. 6 (December 1997)

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• Editorial     p. III
  Christian Colliex
  PDF file (101.2 KB)



• Fabrication of Nano-Tips by Carbon Contamination in a Scanning Electron Microscope for Use in Scanning Probe Microscopy and Field Emission     p. 355
  Massimo Antognozzi, Andrea Sentimenti and Ugo Valdrè
  Abstract | PDF file (1.988 MB) | References



• Quantitative EELS by Spectrum Parametrization     p. 369
  Abdelaziz Aitouchen, Yolande Kihn and Gérald Zanchi
  Abstract | PDF file (979.0 KB) | References



• Bimetallic PdCu and PdCu₃ Particles Prepared by Wet Impregnation-HRTEM Study of the Structure and the Interface with the MgO Substrate     p. 379
  Suzanne Giorgio and Claude Henry
  Abstract | PDF file (3.089 MB) | References



• A Scanning Force Microscope Combined with a Scanning Electron Microscope for Multidimensional Data Analysis     p. 393
  Michel Troyon, Hei Ning Lei, Zhonghuai Wang and Guangyi Shang
  Abstract | PDF file (1.755 MB) | References



• Electron Beam Induced Structural Modification of the Oxidized Silicon Micro-Clusters in ZnO Matrix     p. 403
  Umadapa Pal, Naoto Koshizaki, Shin-ya Terauchi and Takeshi Sasaki
  Abstract | PDF file (1.456 MB) | References



• Ion Beam Implantation and Plasma Immersion Ion Implantation. Application on Nitrided Ti-6Al-4V Titanium Alloy     p. 413
  Agnès Fabre, Laurent Barrallier, Frank Torregrosa and Laurent Roux
  Abstract | PDF file (1.017 MB) | References

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© EDP Sciences 1997