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Foreword
| Issue |
Microsc. Microanal. Microstruct.
Volume 4, Number 2-3, April / June 1993
|
|
|---|---|---|
| Page(s) | V - V | |
| DOI | https://doi.org/10.1051/mmm:0199300402-30R500 | |
Microsc. Microanal. Microstruct. 4, V-V (1993)
DOI: 10.1051/mmm:0199300402-30R500
1 CEMES/LOE, Toulouse
2 ENSEEG, Toulouse
3 Nagoya University
PACS
0778 - Electron, positron, and ion microscopes; electron diffractometers.
Key words
Dislocation motion -- High-voltage electron microscopy -- Electron microscopy -- In situ -- Electron beam effects -- Ion beam effects -- Phase transformations
© EDP Sciences 1993
DOI: 10.1051/mmm:0199300402-30R500
Preface
D. Caillard1, F. Louchet2 et H. Saka31 CEMES/LOE, Toulouse
2 ENSEEG, Toulouse
3 Nagoya University
Without abstract
PACS
0778 - Electron, positron, and ion microscopes; electron diffractometers.
Key words
Dislocation motion -- High-voltage electron microscopy -- Electron microscopy -- In situ -- Electron beam effects -- Ion beam effects -- Phase transformations
© EDP Sciences 1993
First page of the article
