Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 4, Number 6, December 1993
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|---|---|---|
| Page(s) | I - II | |
| DOI | https://doi.org/10.1051/mmm:0199300406049900 | |
Microsc. Microanal. Microstruct. 4, I-II (1993)
DOI: 10.1051/mmm:0199300406049900
Laboratoire de Microscopie Ionique, URA CNRS 808 Université de Rouen, Mont Saint-Aignan (France)
PACS
7970 - Field emission, ionization, evaporation, and desorption.
6837V - Field emission and field-ion microscopy.
Key words
Field emission -- Field emission electron microscopy -- Field ion emission -- STM -- Liquid metal ion sources -- Atom probe -- Surface reactions -- Field desorption -- Microstructure -- Quantitative chemical analysis -- Vacuum microelectronics -- Symposium
© EDP Sciences 1993
DOI: 10.1051/mmm:0199300406049900
The 40th International Field Emission Symposium in Nagoya (Japan), 1-5 august 1993
Alain MenandLaboratoire de Microscopie Ionique, URA CNRS 808 Université de Rouen, Mont Saint-Aignan (France)
Without abstract
PACS
7970 - Field emission, ionization, evaporation, and desorption.
6837V - Field emission and field-ion microscopy.
Key words
Field emission -- Field emission electron microscopy -- Field ion emission -- STM -- Liquid metal ion sources -- Atom probe -- Surface reactions -- Field desorption -- Microstructure -- Quantitative chemical analysis -- Vacuum microelectronics -- Symposium
© EDP Sciences 1993
First page of the article
