Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 5, Number 2, April 1994
|
|
|---|---|---|
| Page(s) | 165 - 167 | |
| DOI | https://doi.org/10.1051/mmm:0199400502016500 | |
Microsc. Microanal. Microstruct. 5, 165-167 (1994)
DOI: 10.1051/mmm:0199400502016500
Laboratoire de Physique des Solides Université Paris- Sud 91405 Orsay, France
PACS
0130V - Book reviews.
Key words
Book review -- Electron diffraction -- Imaging -- STEM -- Convergent beam method -- Crystallography -- Analysis method -- Electron beam applications -- Teaching -- Electron holography -- Aharonov-Bohm effect -- Magnetic domains -- Electron optics -- Fluxons -- Electron microdiffraction
© EDP Sciences 1994
DOI: 10.1051/mmm:0199400502016500
Book reviews
Christian ColliexLaboratoire de Physique des Solides Université Paris- Sud 91405 Orsay, France
Without abstract
PACS
0130V - Book reviews.
Key words
Book review -- Electron diffraction -- Imaging -- STEM -- Convergent beam method -- Crystallography -- Analysis method -- Electron beam applications -- Teaching -- Electron holography -- Aharonov-Bohm effect -- Magnetic domains -- Electron optics -- Fluxons -- Electron microdiffraction
© EDP Sciences 1994
First page of the article
