Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 4, Number 1, February 1993
Page(s) 63 - 85
DOI https://doi.org/10.1051/mmm:019930040106300
Microsc. Microanal. Microstruct. 4, 63-85 (1993)
DOI: 10.1051/mmm:019930040106300

Electron Compton scattering in a symmetric two-beam scattering geometry

Peter Jonas et Peter Schattschneider

Institut für Angewandte und Technische Physik, Technische Universität Wien, Wiedner Hauptstraße 8-10, A-1040 Wien


Abstract
The aim of this work is to present an experimental procedure to measure directional Compton profiles by means of electron energy-loss spectroscopy in the transmission electron microscope. In order to obtain unique profiles with a well defined orientation in momentum space a symmetric two-beam scattering geometry taking advantage of crystal symmetry was developped. Measurements on single crystal silicon are discussed in comparison to results of other Compton scattering techniques and theoretical calculations.

PACS
7920U - Electron energy loss spectroscopy.

Key words
Energy losses -- Energy-loss spectroscopy -- Electron spectroscopy -- Compton effect -- Electrons -- Experimental study -- Transmission electron microscopy -- Crystals -- Silicon -- Theoretical study -- Metrology -- Physics -- Impact phenomena -- Condensed matter physics -- Materials science -- Condensed state physics


© EDP Sciences 1993