Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 4, Number 1, February 1993
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|---|---|---|
| Page(s) | 63 - 85 | |
| DOI | https://doi.org/10.1051/mmm:019930040106300 | |
Microsc. Microanal. Microstruct. 4, 63-85 (1993)
DOI: 10.1051/mmm:019930040106300
Institut für Angewandte und Technische Physik, Technische Universität Wien, Wiedner Hauptstraße 8-10, A-1040 Wien
7920U - Electron energy loss spectroscopy.
Key words
Energy losses -- Energy-loss spectroscopy -- Electron spectroscopy -- Compton effect -- Electrons -- Experimental study -- Transmission electron microscopy -- Crystals -- Silicon -- Theoretical study -- Metrology -- Physics -- Impact phenomena -- Condensed matter physics -- Materials science -- Condensed state physics
© EDP Sciences 1993
DOI: 10.1051/mmm:019930040106300
Electron Compton scattering in a symmetric two-beam scattering geometry
Peter Jonas et Peter SchattschneiderInstitut für Angewandte und Technische Physik, Technische Universität Wien, Wiedner Hauptstraße 8-10, A-1040 Wien
Abstract
The aim of this work is to present an experimental procedure to measure directional Compton profiles by means of electron energy-loss spectroscopy in the transmission electron microscope. In order to obtain unique profiles with a well defined orientation in momentum space a symmetric two-beam scattering geometry taking advantage of crystal symmetry was developped. Measurements on single crystal silicon are discussed in comparison to results of other Compton scattering techniques and theoretical calculations.
7920U - Electron energy loss spectroscopy.
Key words
Energy losses -- Energy-loss spectroscopy -- Electron spectroscopy -- Compton effect -- Electrons -- Experimental study -- Transmission electron microscopy -- Crystals -- Silicon -- Theoretical study -- Metrology -- Physics -- Impact phenomena -- Condensed matter physics -- Materials science -- Condensed state physics
© EDP Sciences 1993