Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 2, April 1995
|
|
|---|---|---|
| Page(s) | 249 - 249 | |
| DOI | https://doi.org/10.1051/mmm:0199500602024900 | |
Microsc. Microanal. Microstruct. 6, 249-249 (1995)
DOI: 10.1051/mmm:0199500602024900
CEMES-LOE, CNRS Toulouse, France
PACS
0130V - Book reviews.
0130C - Conference proceedings.
6172 - Defects and impurities in crystals; microstructure.
564230V - Image forming and processing.
Key words
Book review -- Defect detection -- Image processing -- Proceedings -- Semiconductor materials -- Semiconductor devices
© EDP Sciences 1995
DOI: 10.1051/mmm:0199500602024900
Book review: Defect Recognition and Image Processing in Semiconductors and Devices J. Jimenez Institute of Physics Conference Series 135, 1994
André RocherCEMES-LOE, CNRS Toulouse, France
Without abstract
PACS
0130V - Book reviews.
0130C - Conference proceedings.
6172 - Defects and impurities in crystals; microstructure.
564230V - Image forming and processing.
Key words
Book review -- Defect detection -- Image processing -- Proceedings -- Semiconductor materials -- Semiconductor devices
© EDP Sciences 1995
First page of the article
