Free Access
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
Page(s) 559 - 572
Microsc. Microanal. Microstruct. 6, 559-572 (1995)
DOI: 10.1051/mmm:1995148

Application of One-Dimensional Analytical Models for the Interpretation of Observations of Superconducting Fluxons

Giulio Pozzi1, John E. Bonevich2, 3, Ken Harada2, Hiroto Kasai2, Tsuyoshi Matsuda2, Takaho Yoshida2 et Akira Tonomura2

1  Department of Physics and Istituto Nazionale di Fisica della Materia, University of Bologna, viale B. Pichat 6, 40127 Bologna, Italy
2  Advanced Research Laboratory, Hitachi, Ltd., Hatoyama, Saitama 350-03, Japan
3  Lawrence Berkeley Laboratory, Materials Science Division, MS72-150, 1 Cyclotron Road, Berkeley, CA 94720 U.S.A.

in order to extract quantitative information from the two-dimensional images of superconducting fluxons observed in thin tilted specimens by means of holographic or out-of-focus methods, one-dimensional line scans are taken and compared with the theoretical predictions. In particular, the trend of the reconstructed phase across the fluxon core, or the intensity distribution of its out-of-focus image have a strong similarity with those calculated by means of previous one-dimensional models, where the fluxon was considered lying perpendicular to the electron beam. This work exploits this analogy showing that, in spite of the different geometry, suitably modified one-dimensional models can be usefully applied for the interpretation of the experimental results and the analysis of the experimental conditions as well as for the assessment of new methods, like f.i. the one proposed for discriminating between London and Clem models.

6116D - Electron microscopy determinations of structures.
7460G - Flux pinning, flux motion, fluxon defect interactions.

Key words
electron microscopy -- flux line lattice -- superconducting fluxons -- 1D analytical models -- thin tilted specimens -- out of focus methods -- holographic methods -- reconstructed phase -- intensity distribution -- Clem model -- London model -- electron microscopy

© EDP Sciences 1995