Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
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Page(s) | 665 - 672 | |
DOI | https://doi.org/10.1051/mmm:1995156 |
Microsc. Microanal. Microstruct. 6, 665-672 (1995)
DOI: 10.1051/mmm:1995156
Electron Microscopy Centre, Physics Department of the University and INFM-CNR, via Irnerio 46, 40126 Bologna, Italy
3110C - Ferromagnetic materials.
3120B - Magnetic recording.
Key words
cobalt -- coercive force -- ferromagnetic materials -- magnetic force microscopy -- magnetic recording -- nickel -- Permalloy -- image contrast effects -- field trends -- magnetic recording media -- static magnetic force microscopy -- Co -- Ni -- Permalloy probes -- low coercivity -- z component -- stray magnetic field -- digital recording media -- Floptical -- cantilever deflections -- probe sample distance -- FeNi
© EDP Sciences 1995
DOI: 10.1051/mmm:1995156
Study of Image Contrast Effects and Field Trends in Magnetic Recording Media by Static Magnetic Force Microscopy
Stefano Pergolini et Ugo ValdrèElectron Microscopy Centre, Physics Department of the University and INFM-CNR, via Irnerio 46, 40126 Bologna, Italy
Abstract
Co, Ni and Permalloy probes for Magnetic Force
Microscopy have been characterized. The latter type of probe
shows a particular behaviour which has been interpreted on the
basis of the low coercivity of the Permalloy. The trend of the
force due to the z-component of the stray magnetic field of
digital recording media (Floptical) has been worked out, from
the cantilever deflections, as a function of probe-sample
distance and interpreted.
3110C - Ferromagnetic materials.
3120B - Magnetic recording.
Key words
cobalt -- coercive force -- ferromagnetic materials -- magnetic force microscopy -- magnetic recording -- nickel -- Permalloy -- image contrast effects -- field trends -- magnetic recording media -- static magnetic force microscopy -- Co -- Ni -- Permalloy probes -- low coercivity -- z component -- stray magnetic field -- digital recording media -- Floptical -- cantilever deflections -- probe sample distance -- FeNi
© EDP Sciences 1995