Free Access
Microsc. Microanal. Microstruct.
Volume 7, Number 4, August 1996
Page(s) 207 - 215
Microsc. Microanal. Microstruct. 7, 207-215 (1996)
DOI: 10.1051/mmm:1996116

The Use of Morphological Filters in Computing Displacement Fields in a Sequence of S.E.M. Images

Najet Ben Amar, Azeddine Beghdadi et Patrick Viaris de Lesegno

Laboratoire des Propriétés Mécaniques et Thermodynamiques des Matériaux, CNRS, Institut Galilée, Université Paris Nord, avenue J.B. Clément, 93430 Villetaneuse, France

In order to quantify the material deformation when submitted to mechanical solicitations, we propose a new technique based on a set of image analysis operations. It consists in measuring the displacements of some geometrical points selected on the surface of the deformed material and considered as landmarks. More details about this technique, presented below, are justified by actual applications.

0780 - Electron and ion microscopes and techniques.
0630C - Spatial variables measurement.
0630M - Measurement of mechanical variables.
4230V - Image processing and restoration.

Key words
image processing -- scanning electron microscopy -- spatial variables measurement -- strain measurement -- morphological filters -- computing displacement fields -- SEM images -- deformation -- mechanical solicitations -- image analysis operations

© EDP Sciences 1996