Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 1, Number 1, February 1990
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Page(s) | 55 - 67 | |
DOI | https://doi.org/10.1051/mmm:019900010105500 |
References of Microsc. Microanal. Microstruct. 1 55-67
- Sayers D.E., Stern E.A., Lyttle F.W., Phys. Rev. Let. 27 (1971) 1204. [CrossRef]
- Leapman R.D., Grunes L.A., Fejes P.L., Silcox J., EXAFS Spectroscopy, Eds. B. K. Teo and D. C. Joy (Plenum Press) 1981, pp. 217-239.
- Garg R.K., Balossier G., Sevely J., Thomas X., Bonhomme P., Le Vide, Les Couches Minces: Supplément Revue n° 232 (1986) 87-91.
- Claverie A., Vieu C., Fauré J., Beauvillain J., J. Appl. Phys. 64 (1988) 4415-4423. [CrossRef]
- Vieu C., Claverie A., Fauré J. and Beauvillain J., Nucl. Instrum. Meth. B36 (1989) 137-149.
- Pinna H., Sirvin R., Kihn Y., Sevely J., Jouffrey B., J. Electron. Microsc. Tech. 3 (1986) 135-149. [CrossRef]
- Zanchi G., Sevely J., Jouffrey B., J. Microsc. Spectrosc. Electron. 2 (1977) 95-104.
- Kihn Y., Perez J. Ph., Sevely J., Zanchi G. and Jouffrey B., Elect. Microscopy (7th European Congress, The Hague) 4 (1980) 42-45.
- Washburn J., Murty C.S., Sadana D., Byrne P., Gronsky R., Cheung N., Kilaas R., Nucl. Instrum. Meth. Phys. Res. 209/210 (1983) 345-350. [CrossRef]
- Sevely J., Garg R.K., Zanchi G., Jouffrey B., J. Microsc. Spectrosc. Electron. 10 (1985) 32a.
- Garg R.K., Sevely J., Jouffrey B., Microelectronics and Photonics, Ed. R. P. Bajpai (Siddarth Publications, New Delhi, India) 1987, pp. 335-339.
- Jouffrey B.,Sevely J., Zanchi G., Kihn Y., SEM/III, SEM Inc., AMF O'Hare (Chicago) 1985, pp. 1063-70.
- Sevely J., EMAG' 85, Newcastle upon Tyne (1985) pp. 155-160.
- Bevington P.R., Data Reduction and Error Analysis for the Physical Sciences (Mc Graw-Hill Book Company, New York) Chapter 8 (1968) p. 140-142.
- Lee P.A., Beni G., Phys. Rev. B15 (1977) 2862-83.
- Teo B.K.; Lee P.A., J. Am. Chem. Soc. 101 (1979) 2815-32. [CrossRef]
- Comin F., Innoccia L., Lagarde P., Rossi G., Citrin P.H., phys. Rev. Lett. 54 (1985) 122-125. [CrossRef] [PubMed]
- Beauvillain J., Claverie A., Jouffrey B., J. Cryst. Growth 64 (1983) 549. [CrossRef]