Free Access
Editorial
Issue
Microsc. Microanal. Microstruct.
Volume 1, Number 4, August 1990
Page(s) I - III
DOI https://doi.org/10.1051/mmm:01990001040R100
References of Microsc. Microanal. Microstruct. 1 I-III
  • Cosslett VE., Electron diffraction in carbon tetrachloride vapour Trans. Faraday Soc. 30(1934) 981. [CrossRef]
  • Cosslett VE., The variation of resolution with voltage in the magnetic electron microscope Proc. Phys. Soc. 58(1946) 443. [CrossRef]
  • Cosslett VE., Introduction to Electron Optics (Clarendon Press, Oxford) 1946.
  • Cosslett VE. and Jones D., Design of combined electron microscope and diffraction apparatus, Comptes Rendus Congrès International de Microscopie Électronique, Société Française de Microscopie Théorique et Appliquée et CNRS (1950) p.213.
  • Cosslett VE., The prospects of examining living matter in the electron microscope, id (1950) p.555.
  • Cosslett VE., Practical Electron Microscopy (Butterworths) 1951.
  • Cosslett V.E. and Nixon W.C., The X-ray shadow microscope, J. Appl. Phys. 24 (1953) 616. [CrossRef]
  • Cosslett VE. and Haine M.E., The tungsten point cathode as an electron source, Proc. Int. Conf. E.M., London (1954) p.639.
  • Cosslett VE., X-ray Microscopy: a rival to electron microscopy ? Rapport Europees Congres Toegepaste Electronenmicroscopie Ed G. Vandermeerssche (Presses des Ateliers Publicitaires) 1954, p.281.
  • Cosslett V.E., Problèmes soulevés par la technique des spécimens et les opérations au microscope électronique lorsqu'on désire obtenir une très haute résolution. Les techniques récentes en microscopie électronique et corpusculaire, CNRS, Ed. Ch. Fert (1955) p.27.
  • Duncumb P. and Cosslett V.E., A scanning microscope for X-ray emission pictures, Proc. Symp. X-ray Microscopy and Microradiography, Cambridge (1957) p.374.
  • Dolby R.M. and Cosslett VE., A spectrometer system for long wavelength X-ray emission microanalysis, Proc. second Int. Symp. on X-ray Microscopy and X-ray Microanalysis, Stockholm (1961) p.351.
  • Smith K.C.A., Considine K. and Cossletr VE., A new 750 kV electron microscope, 6th International Congress for Electron Microscopy, Kyoto, 1 (1966) 99.
  • Cosslett VE., Energy loss and chromatic aberration in electron microscopy Z. Angew. Phys. 27 (1969) 138.
  • Cosslett V.E., High Voltage Electron Microscopy, Quart. Rev. Biophys. 2(1969) 95.
  • Wittry D.B., Ferrier R.P. and Cosslett V.E., Selected-area electron spectrometry in the transmission microscope J. Phys. D 2 (1969) 1767. [CrossRef]
  • Cosslett V.E., Recent developments in instrumentation for High Voltage Electron Microscopy, IVth International Congress for High Voltage Electron Microscopy, Eds. B. Jouffrey et P. Favard, published by SFME (1975) p.13.
  • Cosslett VE., A 600 kV microscope designed for high resolution, Proc. 5th Int. Conf. High Electron Microscopy, Kyoto (1977) p.87.