Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 1, Number 5-6, October / December 1990
Page(s) 481 - 492
DOI https://doi.org/10.1051/mmm:0199000105-6048100
References of Microsc. Microanal. Microstruct. 1 481-492
  • Muller E.W., Z. Phys. 131 (1951) 136-142. [CrossRef]
  • Muller E.W., Panitz J.A. and McLane S.B., Rev. Sci. Instrum. 39 (1968) 83-86. [CrossRef]
  • Kellog G.L. and Tsong T.T., J. Appl. Phys. 51 (1980) 1184-1193. [CrossRef]
  • Grovenor C.R.M., Cerezo A. and Smith G.D.W., Microsc. Semicond. Mater. Conf Oxford (21-23 March 1983); Inst. Phys. Conf. Ser. 67 (1983) 109-114.
  • Chambreland S., Walder A. and Blavette D., Acta met. 36 (1988) 3205-3215. [CrossRef]
  • Blavette D., Buchon A. and Chambreland S., Proc. of Euromat. Aachen (nov 1989), to be published.
  • Andren H.O., J. Phys. Colloq. France 47 (1986) C7. 483-488. [CrossRef]
  • Blavette D., Menand A., Les techniques de l'ingénieur; Analyse chimique et caractérisation (1989) p.900; 1-14.
  • Blavette D. and Menand A., Ann. Chim. 11 (1986) 321-384.
  • Muller M.K., Internat. Mat. Rev. 32 (1987) 221-240.
  • Blavette D. and Bostel A., Surf. Sci. Lett. 177 (1986) 994-398. [CrossRef]
  • Blavette D. and Bostel A., Acta. Met. 32 (1984) 811. [CrossRef]
  • Karlsson L. and Norden H., J. Phys Colloq. France 45 (1984) C9 391-396.
  • Norden H. and Andren H.O., Surf. Interface Analys. 12 (1988) 179-184. [CrossRef]
  • Buchon A., Menand A. and Blavette D., Surf. Sci. (to be published)
  • Miller M.K. and Norton J.A., J. Phys. Colloq. France 48 (1987) C6379-384. [CrossRef]
  • Sieloff D.D., Brenner S.S. and Burke M.G., J. Phys. Colloq. France 47 (1986) C7 298-303.
  • Stiller K., J. Phys. Colloq. France 50 (1989) C8329-334.
  • Alvensleben L.V., J. Phys. Colloq. France 49 (1988) C6 335-340.
  • Auger P., Danoix F., Menand A., Bonnet S., Bourgoin J., Guttmann M., Mater. Sci. Techn. 6 (1990) 301-313.
  • Brenner S.S., Miller M.K. and Soffa W.A., Scr. Met. 16 (1982) 831-836. [CrossRef]
  • Zhu F., Wendt H. and Haasen P., Scr. Met. 16 (1982) 1175-1180. [CrossRef]
  • Miller M.K. and Bentley J., J. Phys. Colloq. France 47 (1986) C7 239-244. [CrossRef]
  • Cerezo A., Godfrey T.J., Grovenor C.R.M., Hetherington M.G., Hoyle R.M., Jakubovics J.P., Liddle J.A., Smith G.D.W. and Worral G.M., J. Microscopy 154 (1989) 215-225.
  • Langer J.S., Bar-On M. and Miller H.D., Phys. Rev. A. 11 (1975) 1417-1429. [CrossRef]
  • Loiseau A., Van Tendeloo G., Portier R. and Ducastelle F., J. Phys. France 46 (1985) 595-613. [CrossRef] [EDP Sciences]
  • Brodin D., Van Tendeloo G., Van Landuyt J., Amelinckx S., Portier R., Guymont M. and Loiseau A., Philos. Mag. A. 54 (1986) 395-419. [CrossRef]
  • Brodin D., Van Tendeloo G., Van Landuyt J., Amelinckx S., Loiseau A., Philos. Mag. B. 57 (1988) 31. [CrossRef]
  • Blavette D., Chambreland S., Loiseau A., Planes J., Ducastelle F., J. Phys Colloq. France 50 (1989) C8 365-370.
  • Blavette D., Caron P. and Khan T., Scr. Met. 20 (1986) 1395. [CrossRef]
  • Bostel A., Blavette D., Menand A. and Sarrau J.M., J. Phys. Colloq. France 50 (1989) 501-506.