Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 2, Number 2-3, April / June 1991
Page(s) 301 - 314
DOI https://doi.org/10.1051/mmm:0199100202-3030100
References of Microsc. Microanal. Microstruct. 2 301-314
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  • Wang Z.L. and Bentley J. , J. Elect. Microsc. Tech. in press (1990).
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  • Bleloch A.L. , Howie A. and Lanzerotti M.Y. , in Proc. XIIth Intern. Cong. for Electron Microscopy ( Seattle) (San Francisco Press) Peachet L.D. and Williams D.B. Eds. 2 ( 1990) 394.
  • Howie A. and Milne R.H. , J. Microsc. 136 (1984) 279.
  • Egerton R.F. , Ultramicroscopy 28 (1989) 215. [CrossRef]
  • Wang Z.L. , J. Elect. Microsc. Tech. 14 ( 1990 ) 13. [CrossRef]
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  • Wang ZL. and Bentley J. , in Proc. XIIth Intern. Cong. for Electron Microscopy ( Seattle) (San Francisco Press) Peachey L.D. and Williams D.B. Eds. 2 (1990) 52; Wang Z.L. and Bentley J. , Ultramicrosc. , in press ( 1990).
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  • see for example Egerton R.F. , Electron energy-loss spectroscopy in the electron microscope (Plenum Press, New York and London, 1986).
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  • Wang Z.L. and Bentley J. , in Proc. 49th Annual meeting of EMSA (San Jose G.W. Bailey Ed. (San Fransisco Press, 1991) in press.