Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 2, Number 5, October 1991
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|---|---|---|
| Page(s) | 515 - 530 | |
| DOI | https://doi.org/10.1051/mmm:0199100205051500 | |
References of Microsc. Microanal. Microstruct. 2 515-530
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- Stern E.A. , Theory of the extended X-ray absorption fine structure Phys. Rev. B10 (1974) 3027-3037.
- Teo B-K. and Lee P.A. , Ab initio calculations of amplitude and phase functions for extended X-ray absorption fine structure spectroscopy J. Am. Chem. Soc . 101(1979 ) 2815-2832. [CrossRef]
- Egerton R.F. , Electron Energy-Loss Spectroscopy in the Electron Microscope pp. 279-281.
- Tafreshi M.A. , Bohm Ch. and Csillag S. , Microsc. Microanal. Microstruct . 1 (1990) 199-213. [CrossRef]
- Egerton R.F. and Crozier P.A. , The use of Fourier techniques in electron energy-loss spectroscopy, Scanning Micros. Suppl. 2. (1988) pp. 245-254.
- Baxter D.V. , The Selection of E0 for EXELFS Spectra of Disordered Systems. EXAFS and Near Edge Structure III, K.O. Hodgsen, B. Hedman and J.E. Penner-Hahn Eds. (Springer-Verlag) pp. 77-79.
- Bourdillon A.J. , El Marshri S.M. and Forty A.J. , Application of extended electron energy loss fine structure to the study of aluminium oxide films, Philos. Mag. 49 (1984) 341-352.
- Disko M.M. , Krivanek O.L. and Rez P. , Orientation dependent extended fine structure in electron energy-loss spectra Phys. Rev. B25 (1982) 4252-4255.