Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
|
|
|---|---|---|
| Page(s) | 513 - 522 | |
| DOI | https://doi.org/10.1051/mmm:1995143 | |
References of Microsc. Microanal. Microstruct. 6 513-522
- Postek M.T. and Joy D.C., J. Res. NBS 92 (1987) 205.
- Joy D.C., J. Microsc. 147 (1987) 51.
- Kuni A., Kembo Y., Yoshiyama K. and Aoki N., Proc. Microelectronics Measur. Tech. Seminar (1980) p. 67.
- Hatsuzawa T., J. Meas. Sci. Technol. 4 (1993) 842. [CrossRef]
- Archard G.D., J. Appl. Phys. 32 (1961) 8. [CrossRef]
- Young J.R., J. Appl. Phys. 28 (1957) 5.