Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
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|---|---|---|
| Page(s) | 523 - 531 | |
| DOI | https://doi.org/10.1051/mmm:1995144 | |
References of Microsc. Microanal. Microstruct. 6 523-531
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- Briggs D. and Seah M.P., Practical Surface Analysis, 2nd edition, vol.2, Ion and Neutral Spectroscopy (J. Wiley & Son, Chichester, New York, 1992).
- Brusatin G., Carnera A. and Gerardi C., Secondary Ion Mass Spectrometry, SIMS VIII, A. Benninghoven, K.T.F. Janssen, J. Tumpner, H.W Werner Eds. (J. Wiley & Son, Chichester, New York, 1992) p. 613.
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- Downsett M.G., Barlow R.D. and Allen P.N., J. Vac. Sci. Technol. B21 (1994) 186.