Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 8, Number 3, June 1997
|
|
|---|---|---|
| Page(s) | 187 - 202 | |
| DOI | https://doi.org/10.1051/mmm:1997114 | |
References of Microsc. Microanal. Microstruct. 8 187-202
- Tanaka M., J. Electron Microsc. 29 (1980) 408-412.
- Cherns D. and Preston A.R., Proc. XIth Int. Cong. on Electron Microscopy, Kyoto (1986) pp. 721-722.
- Carpenter R., Spence J.C.H., Acta Cryst. A38 (1982) 55-68.
- Tanaka M., Terauchi M., Kaneyama T., Convergent Beam Electron Diffraction, Vol. 2 (Jeol Ltd, Tokyo, 1988).
- Cherns D., Morniroli J.P., Ultramicroscopy 53 (1994) 167-180. [CrossRef]
- Morniroli J.P. and Cherns D., Ultramicroscopy 62 (1996) 53-63. [CrossRef]
- Ya Y.f., Wan R.H., Fen J.L., Phil. Mag. Lett. 66 (1992) 197-201. [CrossRef]
- Jesson D.E., Steeds J.W., Ultramicroscopy 31 (1989) 399-430. [CrossRef]
- Spence J.C.H., Zuo J.M., Electron Microdiffraction (Plenum, 1992).
- Jordan I.K., Rossouw C.J., Vincent R., Ultramicroscopy 35 (1991) 237- 243. [CrossRef]
- Xin Y., Duan X.F., Ultramicroscopy 53 (1994) 159-165. [CrossRef]
- Humphreys C.J., Maher D.M., Frazer H.L., Eaglesham D., Phil. Mag. 58 (1988) 787-798. [CrossRef]
- Humphreys C.J., Eaglesham D., Maher D.M., Frazer H.L., Ultramicroscopy 26 (1988) 13-24. [CrossRef]
- Benedict J.P., et al., in: Specimen Preparation for transmission electron microscopy of materials - II, R. Anderson, Ed., MRS Symp. Proc 199 (1990) 189.
- Rabier J., Garem H., Veyssière P., J. Appl. Phys. 47 (1976) 4755-4758. [CrossRef]
- Zhu J., Cowley J.M., Acta Cryst. A38 (1982) 718-728.