The Citing articles tool gives a list of articles citing the current article. The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program . You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
Hubert Lakner , Ludwig Josef Balk , Erich Kubalek
Microsc. Microanal. Microstruct., 2 2-3 (1991) 293-300
This article has been cited by the following article(s):
7 articles
Determination of interface composition in III-V heterojunction devices (HBT and RTD) with atomic resolution using STEM techniques
H. Lakner, C. Mendorf, B. Bollig, W. Prost and F.-J. Tegude Materials Science and Engineering: B 44 (1-3) 52 (1997) https://doi.org/10.1016/S0921-5107(96)01800-4
Isabelle Berbezier and Jacques Derrien 207 (1996) https://doi.org/10.1002/9783527620753.ch4
207 (1996) https://doi.org/10.1002/9783527619283.ch4
Characterization of III - V semiconductor interfaces byZ-contrast imaging, EELS and CBED
Hubert Lakner, Bernd Bollig, Stefan Ungerechts and Erich Kubalek Journal of Physics D: Applied Physics 29 (7) 1767 (1996) https://doi.org/10.1088/0022-3727/29/7/012
H. Lakner 15 (1996) https://doi.org/10.1109/ICIPRM.1996.491922
High spatial resolution extended energy loss fine structure investigations of silicon dioxide compounds
Zou Wei Yuan, Stefan Csillag, Mohammad A. Tafreshi and Christian Colliex Ultramicroscopy 59 (1-4) 149 (1995) https://doi.org/10.1016/0304-3991(95)00037-2
Characterization of AlGaAs/GaAs interfaces by EELS and high‐resolution Z‐contrast imaging in scanning transmission electron microscopy (STEM)
H. Lakner, M. Maywald, L. J. Balk and E. Kubalek Surface and Interface Analysis 19 (1-12) 374 (1992) https://doi.org/10.1002/sia.740190170