Articles citing this article

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Cited article:

A scanning Kelvin probe for synchrotron investigations: thein situdetection of radiation-induced potential changes

Bekir Salgin, Dirk Vogel, Diego Pontoni, et al.
Journal of Synchrotron Radiation 19 (1) 48 (2012)
https://doi.org/10.1107/S0909049511047066

High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)

Michael Rohwerder and Florin Turcu
Electrochimica Acta 53 (2) 290 (2007)
https://doi.org/10.1016/j.electacta.2007.03.016

Work-function measurement by high-resolution scanning Kelvin nanoprobe

Larisa-Emilia Cheran, Sherri Johnstone, Saman Sadeghi and Michael Thompson
Measurement Science and Technology 18 (3) 567 (2007)
https://doi.org/10.1088/0957-0233/18/3/005

Multitip scanning bio-Kelvin probe

I. D. Baikie, P. J. S. Smith, D. M. Porterfield and P. J. Estrup
Review of Scientific Instruments 70 (3) 1842 (1999)
https://doi.org/10.1063/1.1149678

Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions

S. Belaidi, P. Girard and G. Leveque
Journal of Applied Physics 81 (3) 1023 (1997)
https://doi.org/10.1063/1.363884

A high-resolution scanning Kelvin probe microscope for contact potential measurements on the 100 nm scale

W. Nabhan, B. Equer, A. Broniatowski and G. De Rosny
Review of Scientific Instruments 68 (8) 3108 (1997)
https://doi.org/10.1063/1.1148251

Analytical compensation of stray capacitance effect in Kelvin probe measurements

A. Hadjadj, P. Roca i Cabarrocas and B. Equer
Review of Scientific Instruments 66 (11) 5272 (1995)
https://doi.org/10.1063/1.1146098