The Development of Auger Spectroscopy as a Probe of Local Electronic Structure
Microsc. Microanal. Microstruct., 6 3 (1995) 263-288
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Core hole electron screening in InSb
A. Alsawi, C.R.J. Sait, D. Hesp, P. Unsworth, M.J. Ashwin, V.R. Dhanak, T.D. Veal and P. WeightmanJournal of Electron Spectroscopy and Related Phenomena 269 147402 (2023)
https://doi.org/10.1016/j.elspec.2023.147402
Matrix coatings based on anodic alumina with carbon nanostructures in the pores
G.G. Gorokh, M.I. Pashechko, J.T. Borc, et al.Applied Surface Science 433 829 (2018)
https://doi.org/10.1016/j.apsusc.2017.10.117
Encyclopedia of Surface and Colloid Science, Third Edition
John A. Venables and Jingyue LiuEncyclopedia of Surface and Colloid Science, Third Edition 6491 (2015)
https://doi.org/10.1081/E-ESCS3-120000086
First principle calculations of core-level binding energy and Auger kinetic energy shifts in metallic solids
Weine Olovsson, Tobias Marten, Erik Holmström, Börje Johansson and Igor A. AbrikosovJournal of Electron Spectroscopy and Related Phenomena 178-179 88 (2010)
https://doi.org/10.1016/j.elspec.2009.10.007
Electron spectroscopy of disordered metal alloys
P. Weightman and R.J. ColeJournal of Electron Spectroscopy and Related Phenomena 178-179 100 (2010)
https://doi.org/10.1016/j.elspec.2009.05.003
Insight into the local density of states at Si sites at the submonolayer Si/Ge(001)-2 × 1 interface from Si KLV Auger spectroscopy
P Unsworth and P WeightmanJournal of Physics: Condensed Matter 22 (8) 085006 (2010)
https://doi.org/10.1088/0953-8984/22/8/085006
Al Kα and Cu Kα1 excited XPS of vanadium oxide and VF3 powders: Measurement of the V 1s – KLL Auger parameters
G. Beamson, N. Moslemzadeh, P. Weightman and J.F. WattsJournal of Electron Spectroscopy and Related Phenomena 162 (1) 19 (2008)
https://doi.org/10.1016/j.elspec.2007.08.001
Changes in the electronic structure of silicone rubber surfaces induced by oxygen plasma treatment
S. R. Haines, G. Beamson, R. L. Williams and P. WeightmanSurface and Interface Analysis 39 (12-13) 942 (2007)
https://doi.org/10.1002/sia.2646
Electron spectroscopic analysis of silver nanoparticles in a soda-glass matrix
Santanu Bera, P. Gangopadhyay, K.G.M. Nair, B.K. Panigrahi and S.V. NarasimhanJournal of Electron Spectroscopy and Related Phenomena 152 (1-2) 91 (2006)
https://doi.org/10.1016/j.elspec.2006.03.008
Electronic structure of Ti metal and TiO2 powder studied by hard and soft (Cu Kα1 and Al Kα1) X-ray photoelectron and Auger spectroscopy
N. Moslemzadeh, G. Beamson, P. Tsakiropoulos, et al.Journal of Electron Spectroscopy and Related Phenomena 152 (3) 148 (2006)
https://doi.org/10.1016/j.elspec.2006.05.003
High spatial resolution studies of surfaces and small particles using electron beam techniques
J.A. Venables and J. LiuJournal of Electron Spectroscopy and Related Phenomena 143 (2-3) 205 (2005)
https://doi.org/10.1016/j.elspec.2004.05.008
Photoelectron spectroscopy with hard X-rays
W. DrubeNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 547 (1) 87 (2005)
https://doi.org/10.1016/j.nima.2005.05.015
Ab initiocalculation of graphite surface-bulk core-level splitting
Antonín Šimůnek and Jiří VackářPhysical Review B 69 (7) (2004)
https://doi.org/10.1103/PhysRevB.69.073403
Evaluation of the surface contribution to disorder broadened core level XPS spectra in CuPd alloys
S.R Haines, A.W Newton and P WeightmanJournal of Electron Spectroscopy and Related Phenomena 137-140 429 (2004)
https://doi.org/10.1016/j.elspec.2004.02.042
Final state contribution to the Si 2p binding energy shift in SiO2/Si(100)
Th. Eickhoff, V. Medicherla and W. DrubeJournal of Electron Spectroscopy and Related Phenomena 137-140 85 (2004)
https://doi.org/10.1016/j.elspec.2004.02.026
Observation of a surface chemical shift in carbon1score-level photoemission from highly oriented pyrolytic graphite
Richard A. P. Smith, Craig W. Armstrong, Graham C. Smith and Peter WeightmanPhysical Review B 66 (24) (2002)
https://doi.org/10.1103/PhysRevB.66.245409
A wizard source of expertise in XPS
James E. CastleSurface and Interface Analysis 33 (3) 196 (2002)
https://doi.org/10.1002/sia.1202
Stress and Strain in Epitaxy
J. Cazaux and J. OlivierStress and Strain in Epitaxy 287 (2001)
https://doi.org/10.1016/B978-044450865-2/50013-1
Conformation and orientation effects in the X-ray photoelectron spectra of organic polymers
G BeamsonJournal of Electron Spectroscopy and Related Phenomena 121 (1-3) 163 (2001)
https://doi.org/10.1016/S0368-2048(01)00333-4
Report on the 22nd IUVSTA Workshop ?x-ray photoelectron spectroscopy: from physics to data?
L. K�v�rSurface and Interface Analysis 29 (10) 671 (2000)
https://doi.org/10.1002/1096-9918(200010)29:10<671::AID-SIA910>3.0.CO;2-5
Silicon nanoparticles characterization by Auger electron spectroscopy
T. Vdovenkova, V. Strikha and A. TsyganovaSurface Science 454-456 952 (2000)
https://doi.org/10.1016/S0039-6028(00)00138-2
An XPS study of the influence of impurity Cu on the electronic structure of SrS
T. Vdovenkova, A. Vdovenkov and E. SoininenSurface Science 454-456 529 (2000)
https://doi.org/10.1016/S0039-6028(00)00226-0
An X-ray photoelectron study of valence charge in transition metal aluminides
J. E. Castle, S. J. Greaves, M. R. Guascito and A. M. SalviPhilosophical Magazine A 80 (10) 2425 (2000)
https://doi.org/10.1080/01418610008216482
Application of the final state Auger parameter imperfect screening model for the Si L23VV spectrum of porous silicon
T Vdovenkova, V Strikha and A TsyganovaApplied Surface Science 144-145 69 (1999)
https://doi.org/10.1016/S0169-4332(98)00767-3
A new probe of bonding states in intermetallic compounds
J. E. Castle, S. J. Greaves, M. R. Guascito and A. M. SalviPhilosophical Magazine A 79 (5) 1109 (1999)
https://doi.org/10.1080/01418619908210350
ZnS wide band gap semiconductor thin film electronic structure sensitivity to Mn impurity
T. Vdovenkova, A. Vdovenkov and R. TornqvistThin Solid Films 343-344 332 (1999)
https://doi.org/10.1016/S0040-6090(98)01596-X
Auger parameter and Wagner plot in the characterization of chemical states by X-ray photoelectron spectroscopy: a review
Giuliano MorettiJournal of Electron Spectroscopy and Related Phenomena 95 (2-3) 95 (1998)
https://doi.org/10.1016/S0368-2048(98)00249-7
Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
Noel H. Turner and John A. SchreifelsAnalytical Chemistry 70 (12) 229 (1998)
https://doi.org/10.1021/a19800139
Auger spectroscopy and the electronic structure of semiconductors
P. WeightmanJournal of Electron Spectroscopy and Related Phenomena 93 (1-3) 165 (1998)
https://doi.org/10.1016/S0368-2048(98)00170-4
Oxide electronic polarizabilities and aluminum coordination at the outer surface of zeolites obtained by X-ray photoelectron spectroscopy
Francesco Filippone and Giuliano MorettiApplied Surface Science 135 (1-4) 150 (1998)
https://doi.org/10.1016/S0169-4332(98)00257-8
Analysis of the M4,5-N4,5N4,5 spectrum of Ag by Auger photoelectron coincidence spectroscopy
C.P. Lund and S.M. ThurgateSurface Science 376 (1-3) L403 (1997)
https://doi.org/10.1016/S0039-6028(97)80013-1
Auger electron spectroscopy study of the electronic structure of porous silicon–metal interfaces
T Vdovenkova, V Strikha and V VikulovJournal of Electron Spectroscopy and Related Phenomena 83 (2-3) 159 (1997)
https://doi.org/10.1016/S0368-2048(96)03067-8
Frontiers in Nanoscale Science of Micron/Submicron Devices
P. WeightmanFrontiers in Nanoscale Science of Micron/Submicron Devices 135 (1996)
https://doi.org/10.1007/978-94-009-1778-1_12