Direct Measurements of the Radiolytic Transformation of Thin Films of Titanium Dioxide using EELS
Microsc. Microanal. Microstruct., 6 4 (1995) 433-440
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Correlation between deposition parameters of periodic titanium metal/oxide nanometric multilayers and their chemical and structural properties investigated by STEM-EELS
Valérie Potin, Arnaud Cacucci and Nicolas MartinMicron 101 62 (2017)
https://doi.org/10.1016/j.micron.2017.06.008
TEM-HRTEM study on the dehydration process of nanostructured Mg–Ca hydroxide into Mg–Ca oxide
L.S. Gomez-Villalba, A. Sierra-Fernandez, M.E. Rabanal and R. FortCeramics International 42 (8) 9455 (2016)
https://doi.org/10.1016/j.ceramint.2016.03.007
The Ti to TiO and TiO to Anatase Transformations Induced by Anodizing and Annealing Treatments of Ti Thin Film
Yu-Lin Chung, Der-Shin Gan and Keng-Liang OuJournal of The Electrochemical Society 159 (3) C133 (2012)
https://doi.org/10.1149/2.097203jes
Mapping titanium and tin oxide phases using EELS: An application of independent component analysis
F. de la Peña, M.-H. Berger, J.-F. Hochepied, et al.Ultramicroscopy 111 (2) 169 (2011)
https://doi.org/10.1016/j.ultramic.2010.10.001
Study of the TiO to Anatase Transformation by Thermal Oxidation of Ti Film in Air
Chung-Ho Kao, Sung-Wei Yeh, Hsing-Lu Huang, Dershin Gan and Pouyan ShenThe Journal of Physical Chemistry C 115 (13) 5648 (2011)
https://doi.org/10.1021/jp109082g
Advances in EELS spectroscopy by using new detector and new specimen preparation technologies
C. Scheu, M. Gao, K. Van Benthem, S. Tsukimoto, S. Schmidt, W. Sigle, G. Richter and J. ThomasJournal of Microscopy 210 (1) 16 (2003)
https://doi.org/10.1046/j.1365-2818.2003.01181.x
Progress in the Preparation of Cross-Sectional TEM Specimens by Ion-Beam Thinning
Adolf Strecker, Ute Bäder, Marion Kelsch, et al.Zeitschrift für Metallkunde 94 (3) 290 (2003)
https://doi.org/10.3139/146.030290
Can fresnoite (Ba2TiSi2O8) incorporate Ti3+when crystallizing from highly reduced melts?
Thomas Höche, Hans-Joachim Kleebe and Rik BrydsonPhilosophical Magazine A 81 (4) 825 (2001)
https://doi.org/10.1080/01418610151133258