Articles citing this article

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Cited article:

Progress in the Characterization of Layered Structures by X-Ray Microanalysis

David G. Rickerby

Microsc. Microanal. Microstruct., 6 5-6 (1995) 621-631

DOI: https://doi.org/10.1051/mmm:1995152

This article has been cited by the following article(s):

Impact of Electron and Scanning Probe Microscopy on Materials Research

D. G. Rickerby
Impact of Electron and Scanning Probe Microscopy on Materials Research 367 (1999)
https://doi.org/10.1007/978-94-011-4451-3_16

Microstructural examination of layered coatings by scanning electron microscopy, transmission electron microscopy, and atomic force microscopy

D.G. Rickerby and T. Friesen
Materials Characterization 36 (4-5) 213 (1996)
https://doi.org/10.1016/S1044-5803(96)00053-8

Microbeam and Nanobeam Analysis

David G. Rickerby
Microbeam and Nanobeam Analysis 493 (1996)
https://doi.org/10.1007/978-3-7091-6555-3_43