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Cited article:

Profilométrie par spectrométrie de masse d'ions secondaires de couches alternées cobalt-cuivre. Influence des conditions de pulvérisation sur la résolution en profondeur
SIMS profiling of metallic multilayers Co/Cu/Co. Effects of bombardment parameters on depth resolution

François Jomard, Marcel Perdereau

Microsc. Microanal. Microstruct., 8 4-5 (1997) 273-286

DOI: https://doi.org/10.1051/mmm:1997121

This article has been cited by the following article(s):

Magnetic Properties of Metals: Magnetic and Electric Properties of Magnetic Metallic Multilayers

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Magnetic Properties of Metals: Magnetic and Electric Properties of Magnetic Metallic Multilayers 636 (2022)
https://doi.org/10.1007/978-3-662-64909-1_25

Sputtering of stepped Cu surfaces by 3 keV Ar projectiles with glancing angles of incidence

M.A. Karolewski
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 211 (2) 190 (2003)
https://doi.org/10.1016/S0168-583X(03)01276-X