Articles citing this article

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Cited article:

Two remarkable defect related electron diffraction effects

Marc Verwerft, Wout Luyten, Severin Amelinckx

Microsc. Microanal. Microstruct., 1 3 (1990) 167-173

DOI: https://doi.org/10.1051/mmm:0199000103016700

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Electron microscopy study of coiled carbon tubules

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Philosophical Magazine A 71 (3) 605 (1995)
DOI: 10.1080/01418619508244470
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Electron microscopy and energy-loss spectroscopy of voidites in pure type IaB diamonds

W. Luyten, G. Van Tendeloo, P. J. Fallon and G. S. Woods
Philosophical Magazine A 69 (4) 767 (1994)
DOI: 10.1080/01418619408242517
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Transmission electron energy-loss spectroscopy measurements of the dielectric function of Si/SiO2 multilayers

J. Keränen, T. Lepistö, L. Ryen, S. V. Novikov and E. Olsson
Journal of Applied Physics 84 (12) 6827 (1998)
DOI: 10.1063/1.369014
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