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Cited article:
Raymond F. Egerton
Microsc. Microanal. Microstruct., 2 2-3 (1991) 203-213
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Optimization of digital filters for the detection of trace elements in electron energy loss spectroscopy II. Experiments
J. Michel, N. Bonnet, D. Wagner, G. Balossier and P. Bonhomme
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DOI: 10.1016/0304-3991(93)90177-Y
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Theory of the cross sections for inelastic scattering of electrons by core level excitations in solids
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DOI: 10.1016/S0304-3991(97)00039-9
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Electron energy-loss spectroscopy of boron-doped layers in amorphous thin film silicon solar cells
M. Duchamp, C. B. Boothroyd, M. S. Moreno, et al.
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Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging
Y. Zhu, R.F. Egerton and M. Malac
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EELS studies of Ti-bearing materials and ab initio calculations
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Deposition, microstructure, and properties of nanocrystalline Ti(C,O,N) coatings
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Oscillator-strength parameterization of inner-shell cross sections
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Quantitative EELS by Spectrum Parametrization
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Linking Macroscopic and Nanoscopic Ionic Conductivity: A Semiempirical Framework for Characterizing Grain Boundary Conductivity in Polycrystalline Ceramics
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Examining the Effect of Evaporation Field on Boron Measurements in SiGe: Insights into Improving the Relationship Between APT and SIMS Measurements of Boron
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Imaging Beam‐Sensitive Materials by Electron Microscopy
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