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Cited article:
David W. McComb, Poul L. Hansen, Rik Brydson
Microsc. Microanal. Microstruct., 2 5 (1991) 561-568
This article has been cited by the following article(s):
Energy-Filtering Transmission Electron Microscopy
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Interpretation of electron energy-loss spectra of minerals
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Micron and Microscopica Acta 23 (1-2) 197 (1992)
DOI: 10.1016/0739-6260(92)90136-2
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Electron states of YAG probed by energy-loss near-edge spectrometry and ab initio calculations
Mehmet A. Gülgün, Wai-Yim Ching, Yong-Nian Xu and Manfred Rühle
Philosophical Magazine B 79 (6) 921 (1999)
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Quantitative Microbeam Analysis
R Egerton
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Analyses of EELS fine structures of different silicon compounds
O. Lichtenberger, R. Schneider and J. Woltersdorf
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Electron irradiation induced phase separation in a sodium borosilicate glass
K. Sun, L.M. Wang, R.C. Ewing and W.J. Weber
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Oxygen K near-edge spectra of amorphous silicon suboxides
D. J. WALLIS, P. H. GASKELL and R. BRYDSON
Journal of Microscopy 180 (3) 307 (1995)
DOI: 10.1111/j.1365-2818.1995.tb03690.x
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Quantitative microanalysis using electron energy-loss spectrometry. I. Li and Be in oxides
Ferdinand Hofer and Gerald Kothleitner
Microscopy Microanalysis Microstructures 4 (6) 539 (1993)
DOI: 10.1051/mmm:0199300406053900
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EELS fingerprint of Al-coordination in silicates
P.L. Hansen, R. Brydson, D.W. McComb and I. Richardson
Microscopy Microanalysis Microstructures 5 (3) 173 (1994)
DOI: 10.1051/mmm:0199400503017300
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Seasonal- and age-dependent changes of the structure and chemical composition of the spherites in the midgut gland of the harvestmen Gyas annulatus (Opiliones)
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Changes in Cu–silica interfacial chemistry with oxygen chemical potential
M. Backhaus-Ricoult, L. Samet, M. Thomas, M.-F. Trichet and D. Imhoff
Acta Materialia 50 (16) 4191 (2002)
DOI: 10.1016/S1359-6454(02)00267-7
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SiL- andK-edge x-ray-absorption near-edge spectroscopy of gas-phase Si(CH3)x(OCH3)4−x: Models for solid-state analogs
D. G. J. Sutherland, M. Kasrai, G. M. Bancroft, Z. F. Liu and K. H. Tan
Physical Review B 48 (20) 14989 (1993)
DOI: 10.1103/PhysRevB.48.14989
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ELNES fingerprint of Al coordination in nesosilicates
P.L. Hansen, D. McComb and R. Brydson
Micron and Microscopica Acta 23 (1-2) 169 (1992)
DOI: 10.1016/0739-6260(92)90122-T
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First-principles molecular orbital calculation of electron energy-loss near-edge structures of -quartz
Isao Tanaka and Hirohiko Adachi
Journal of Physics D: Applied Physics 29 (7) 1725 (1996)
DOI: 10.1088/0022-3727/29/7/007
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ELNES across interlayers in SiC(Nicalon) fibre-reinforced Duran glass
R Schneider, J Woltersdorf and O Lichtenberger
Journal of Physics D: Applied Physics 29 (7) 1709 (1996)
DOI: 10.1088/0022-3727/29/7/005
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Qualitative interpretation of electron energy-loss near-edge structure in natural zircon
D W McComb, R Brydson, P L Hansen and R S Payne
Journal of Physics: Condensed Matter 4 (43) 8363 (1992)
DOI: 10.1088/0953-8984/4/43/011
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Microstructure and Chemistry of Intergranular Glassy Films in Liquid-Phase-Sintered Alumina
Rik Brydson, Shih-Chieh Chen, Frank L. Riley, et al.
Journal of the American Ceramic Society 81 (2) 369 (2005)
DOI: 10.1111/j.1151-2916.1998.tb02343.x
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Influence of CaO–SiO2 ratio on the chemistry of intergranular films in liquid-phase sintered alumina and implications for rate of erosive wear
Rik Brydson, Peter C. Twigg, Fiona Loughran and Frank L. Riley
Journal of Materials Research 16 (3) 652 (2001)
DOI: 10.1557/JMR.2001.0120
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p → p-like transitions at the silicon L2,3-edges of silicates
Paul Lenvig Hansen, Rik Brydson and David W. McComb
Microscopy Microanalysis Microstructures 3 (2-3) 213 (1992)
DOI: 10.1051/mmm:0199200302-3021300
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Electron energy-loss near-edge structure in silicate minerals
D W McComb, R S Payne, P L Hansen and R Brydson
Proceedings, annual meeting, Electron Microscopy Society of America 50 (2) 1258 (1992)
DOI: 10.1017/S0424820100130924
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EELS in the High-Resolution STEM
L. M. Brown
Proceedings, annual meeting, Electron Microscopy Society of America 50 (2) 1246 (1992)
DOI: 10.1017/S0424820100130869
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