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Cited article:

Diffraction contrast dependence on sample thickness and incident energy in on-axis Transmission Kikuchi Diffraction in SEM

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Nanoscopic Approaches in Earth and Planetary Sciences

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Nanoscopic Approaches in Earth and Planetary Sciences 57 (2010)
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3D Nanoscale Characterization of Thin-Film Organic Photovoltaic Device Structures via Spectroscopic Contrast in the TEM 1

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The Journal of Physical Chemistry C 114 (41) 17501 (2010)
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Quantitative chemical phase imaging by means of energy filtering transmission electron microscopy

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Characterization of rubber-brass bonding layers by analytical electron microscopy (AEM)

F. Hofer, G. Grubbauer, K. Hummel and T. Kretzschmar
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https://doi.org/10.1163/156856196X00544

On the application of energy filtering TEM in materials science II: Study of a fibre-reinforced metal matrix composite

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On the application of energy filtering TEM in materials science: I. Precipitates in a Ni/Cr-alloy

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Micron 26 (5) 377 (1995)
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Energy-filtering Transmission Electron Microscopy in materials and life science

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Proceedings, annual meeting, Electron Microscopy Society of America 52 936 (1994)
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Determination of the position maximum for electron Compton scattering in electron microscopy

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