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Ultramicroscopy 180 104 (2017)
DOI: 10.1016/j.ultramic.2017.03.011
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Electron Energy-Loss Spectroscopy in the Electron Microscope 29 (2011)
DOI: 10.1007/978-1-4419-9583-4_2
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Angus I. Kirkland and Rüdiger R. Meyer
Microscopy and Microanalysis 10 (4) 401 (2004)
DOI: 10.1017/S1431927604040437
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Andreas Gupper, Asunción Fernández, Christina Fernández-Ramos, et al.
Nanostructured Materials 101 (2002)
DOI: 10.1007/978-3-7091-6740-3_10
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Microscopy and Microanalysis 22 (6) 1369 (2016)
DOI: 10.1017/S1431927616012514
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MRS Bulletin 37 (1) 53 (2012)
DOI: 10.1557/mrs.2011.329
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D. Heinemann, W. Assenmacher, W. Mader, M. Kroschel and M. Jansen
Journal of Materials Research 14 (9) 3746 (1999)
DOI: 10.1557/JMR.1999.0507
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J. Bonevich, D. van Heerden and D. Josell
Journal of Materials Research 14 (5) 1977 (1999)
DOI: 10.1557/JMR.1999.0266
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Journal of Bacteriology 185 (6) 1987 (2003)
DOI: 10.1128/JB.185.6.1987-1994.2003
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Micron 34 (3-5) 211 (2003)
DOI: 10.1016/S0968-4328(03)00037-4
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K. Furuya, M. Osaki, S. Hagiwara and T. Saito
Proceedings, annual meeting, Electron Microscopy Society of America 53 236 (1995)
DOI: 10.1017/S0424820100137550
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DOI: 10.1007/978-3-030-00069-1_13
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DOI: 10.1007/978-3-030-00069-1_1
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