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Cited article:

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Siegfried Hofmann
Springer Series in Surface Sciences, Auger- and X-Ray Photoelectron Spectroscopy in Materials Science 49 205 (2013)
https://doi.org/10.1007/978-3-642-27381-0_5

AES depth profiling with a tilted sample in front of a cylindrical mirror analyzer: quantification and profile shape changes according to an extension of the conventional MRI model

S. Hofmann and J. Y. Wang
Surface and Interface Analysis 39 (1) 45 (2007)
https://doi.org/10.1002/sia.2501

TF_Quantif: a procedure for quantitative mapping of thin films on heterogeneous substrates in electron probe microanalysis (EPMA)

N Dumelié, H Benhayoune and G Balossier
Journal of Physics D: Applied Physics 40 (7) 2124 (2007)
https://doi.org/10.1088/0022-3727/40/7/040

Substrate effects correction in Auger electron spectrometry and electron probe microanalysis of thin films

H. Benhayoune, N. Dumelié and G. Balossier
Thin Solid Films 493 (1-2) 113 (2005)
https://doi.org/10.1016/j.tsf.2005.07.305

An experimental approach to the determination of the surface ionization φ(0) in electron probe microanalysis

G. F. Bastin, J. M. Dijkstra and H. J. M. Heijligers
X-Ray Spectrometry 30 (4) 216 (2001)
https://doi.org/10.1002/xrs.491

Angular‐dependent energy distributions for backscattered electrons—Calculation of the surface ionization

M. Andrae, K. Rührbacher, P. Klein and J. W. Rnisch
Scanning 18 (6) 401 (1996)
https://doi.org/10.1002/sca.1996.4950180602

A new experimental procedure for the backscattering correction in Auger analysis

H. Benhayoune, O. Jbara, X. Thomas, D. Mouze and J. Cazaux
Surface and Interface Analysis 20 (7) 600 (1993)
https://doi.org/10.1002/sia.740200710

Automatic removal of substrate backscattering effects in Auger imaging and spectroscopy

I. R. Barkshire, M. Prutton, J. C. Greenwood and M. M. El Gomati
Surface and Interface Analysis 20 (12) 984 (1993)
https://doi.org/10.1002/sia.740201209