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Cited article:

A New Radio Frequency Plasma Oxygen Primary Ion Source on Nano Secondary Ion Mass Spectrometry for Improved Lateral Resolution and Detection of Electropositive Elements at Single Cell Level

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Isotopic fractionation of silicon negative ions sputtered from minerals by Cs+ bombardment

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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany 379 (2008)
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Morphological and chemical studies of pathological human and mice brain at the subcellular level: Correlation between light, electron, and nanosims microscopies

Carmen Quintana, Ting‐Di Wu, Benoit Delatour, Marc Dhenain, Jean luc Guerquin‐Kern and Alain Croisy
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Image acquisition with immersion objective lenses using electrons emitted with several tenths of an electron volt energies: Towards high spatial resolution ESCA analysis

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SIMION modeling of ion optical effects in Cameca ion microanalyzers: simulation of ion transmission losses

Jan Lorincik, Klaus Franzreb and Peter Williams
Applied Surface Science 231-232 921 (2004)
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