Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

Prospects and Limitations of Energy Filtering TEM in Spectrum Imaging Analysis

J. Mayer, M. Pidun, P. Karduck, A. Zern and K. Hahn
Microscopy and Microanalysis 6 (S2) 1054 (2000)
DOI: 10.1017/S1431927600037764
See this article

Mapping the Subcellular Distribution of Calcium in Depolarized Neurons by Electron Energy Loss Spectrum Imaging

S.B. Andrews, J. Hongpaisan, N.B. Pivovarova, D.D. Friel and R.D. Leapman
Microscopy and Microanalysis 6 (S2) 162 (2000)
DOI: 10.1017/S1431927600033304
See this article

Quantitative Analysis Of Bological Specimens by Spectrum-Imaging in the Energy Filtering Transmission Electron Microscope

R.D. Leapman, C.M. Brooks, N.W. Rizzo and T.L. Talbot
Microscopy and Microanalysis 6 (S2) 160 (2000)
DOI: 10.1017/S1431927600033298
See this article

Comparison of STEM EELS Spectrum Imaging vs EFTEM Spectrum Imaging

J.A. Hunt, G. Kothleitner and R. Harmon
Microscopy and Microanalysis 5 (S2) 616 (1999)
DOI: 10.1017/S1431927600016408
See this article

Compositional Mapping with Energy Filtering TEM: The Present Status

Ferdinand Hofer, Gerald Kothleitner and Peter Warbichler
Microscopy and Microanalysis 7 (S2) 1136 (2001)
DOI: 10.1017/S1431927600031755
See this article

Difference Spectrum Images: Numerical Filters Applied to EELS 3D Data Sets

G. Kothleitner, F. Hofer and C. Trevor
Microscopy and Microanalysis 7 (S2) 1160 (2001)
DOI: 10.1017/S1431927600031871
See this article

Four-Dimensional Dielectric Property Imaging of Low-K Materials for Copper Metallization Using Electron Spectroscopic Imaging Series

S.C. Lo, F.-R. Chen, J.J. Kai, et al.
Microscopy and Microanalysis 7 (S2) 1154 (2001)
DOI: 10.1017/S1431927600031846
See this article

Electron Spectroscopic Imaging and Diffraction: Ideal Tools for the Characterization of Ceramic Materials

J. Mayer, J. Plitzko, J. Marien, S. Krämer and T. Gemming
Microscopy and Microanalysis 5 (S2) 788 (1999)
DOI: 10.1017/S1431927600017268
See this article

EFTEM and STEM EELS Spectrum Imaging

J. A. Hunt and R. H. Harmon
Microscopy and Microanalysis 4 (S2) 152 (1998)
DOI: 10.1017/S1431927600020882
See this article

Interdisciplinary Development of Eels Compositional Mapping

R.D. Leapman
Microscopy and Microanalysis 4 (S2) 122 (1998)
DOI: 10.1017/S1431927600020730
See this article

Elemental maps from EFTEM images using two different background subtraction models

C. Quintana, J.P. Lechaire, N. Bonnet, C. Risco and J.L. Carrascosa
Microscopy Research and Technique 53 (2) 147 (2001)
DOI: 10.1002/jemt.1079
See this article

Tribological behaviour and chemical characterisation of Si-free and Si-containing carbon nitride coatings

C Fernández-Ramos, J.C Sánchez-López, M Belin, et al.
Diamond and Related Materials 11 (2) 169 (2002)
DOI: 10.1016/S0925-9635(01)00650-1
See this article

EFTEM spectrum imaging at high-energy resolution

Bernhard Schaffer, Gerald Kothleitner and Werner Grogger
Ultramicroscopy 106 (11-12) 1129 (2006)
DOI: 10.1016/j.ultramic.2006.04.028
See this article

Principles of Electron Optics

Principles of Electron Optics 1775 (1994)
DOI: 10.1016/B978-0-12-333354-4.50031-8
See this article

Electron energy-loss spectroscopic profiling of thin film structures: 0.39nm line resolution and 0.04eV precision measurement of near-edge structure shifts at interfaces

T. Walther
Ultramicroscopy 96 (3-4) 401 (2003)
DOI: 10.1016/S0304-3991(03)00104-9
See this article

Chemical bond mapping of carbon by image-spectrum EELS in the second derivative mode

Jean Michel Martin, Béatrice Vacher, Laurence Ponsonnet and Vincent Dupuis
Ultramicroscopy 65 (3-4) 229 (1996)
DOI: 10.1016/S0304-3991(96)00071-X
See this article

Image-spectroscopy – I. The advantages of increased spectral information for compositional EFTEM analysis

P.J Thomas and P.A Midgley
Ultramicroscopy 88 (3) 179 (2001)
DOI: 10.1016/S0304-3991(01)00077-8
See this article

Quantitative thin film analysis by energy filtering transmission electron microscopy

J.M Plitzko and J Mayer
Ultramicroscopy 78 (1-4) 207 (1999)
DOI: 10.1016/S0304-3991(99)00021-2
See this article

Comparison of the high Ni VVER-1000 weld microstructure under the primary irradiation and re-irradiation

E.A. Kuleshova, B.A. Gurovich, S.V. Fedotova, et al.
Journal of Nuclear Materials 540 152384 (2020)
DOI: 10.1016/j.jnucmat.2020.152384
See this article

Electron Microscopy

Electron Microscopy 2 (2007)
DOI: 10.1002/9783527614561.ch1
See this article

A Study of Sulphur Diffusion in ZnMgSSe/ZnSe Quantum Wells by Energy-Loss Imaging in a Transmission Electron Microscope

T. Walther, H. Kalisch, K. Heime, et al.
physica status solidi (a) 180 (1) 351 (2000)
DOI: 10.1002/1521-396X(200007)180:1<351::AID-PSSA351>3.0.CO;2-2
See this article

High resolution chemical mapping in the energy-filtering TEM: application to interface layers in ceramics

L Ponsonnet, B Vacher and J.M Martin
Thin Solid Films 324 (1-2) 170 (1998)
DOI: 10.1016/S0040-6090(98)00361-7
See this article

PEELS compositional profiling and mapping at nanometer spatial resolution

Marcel Tencé, Marc Quartuccio and Christian Colliex
Ultramicroscopy 58 (1) 42 (1995)
DOI: 10.1016/0304-3991(94)00177-O
See this article

SrTiO3(100)/(LaMnO3)m(SrMnO3)nlayered heterostructures: A combined EELS and TEM study

J. Verbeeck, O. I. Lebedev, G. Van Tendeloo and B. Mercey
Physical Review B 66 (18) 184426 (2002)
DOI: 10.1103/PhysRevB.66.184426
See this article

Electron tomography and holography in materials science

Paul A. Midgley and Rafal E. Dunin-Borkowski
Nature Materials 8 (4) 271 (2009)
DOI: 10.1038/nmat2406
See this article

Diffusion of oxygen in CdSe-photosensor arrays

U. Klement, F. Ernst, B. Baretzky and J.M. Plitzko
Materials Science and Engineering: B 94 (2-3) 123 (2002)
DOI: 10.1016/S0921-5107(01)00899-6
See this article

Principle and Applications of EELS Spectroscopy in Material Characterizations

Sang-Won Yoon, Kyou-Hyun Kim, Jae-Pyoung Ahn and Jong-Ku Park
Journal of Korean Powder Metallurgy Institute 14 (3) 157 (2007)
DOI: 10.4150/KPMI.2007.14.3.157
See this article

Comparison of EFTEM and STEM EELS plasmon imaging of gold nanoparticles in a monochromated TEM

Bernhard Schaffer, Werner Grogger, Gerald Kothleitner and Ferdinand Hofer
Ultramicroscopy 110 (8) 1087 (2010)
DOI: 10.1016/j.ultramic.2009.12.012
See this article

Preliminary investigation of two methods for the automatic handling of multivariate maps in microanalysis

Noël Bonnet
Ultramicroscopy 57 (1) 17 (1995)
DOI: 10.1016/0304-3991(94)00163-H
See this article

Interactive Image-Spectrum EELS: Application to Elemental Mapping of Lubricant Colloids

Jean-Michel Martin, Jean-Louis Lavergne, Béatrice Vacher and Kyioshi Inoue
Microscopy Microanalysis Microstructures 6 (1) 53 (1995)
DOI: 10.1051/mmm:1995107
See this article

Reference Module in Chemistry, Molecular Sciences and Chemical Engineering

Vladimir P. Oleshko
Reference Module in Chemistry, Molecular Sciences and Chemical Engineering (2018)
DOI: 10.1016/B978-0-12-409547-2.14406-3
See this article

Gentle quantitative measurement of helium density in nanobubbles in silicon by spectrum imaging

Kévin Alix, Marie-Laure David, Guillaume Lucas, et al.
Micron 77 57 (2015)
DOI: 10.1016/j.micron.2015.05.011
See this article

Superlow friction of ta-C lubricated by glycerol: An electron energy loss spectroscopy study

L. Joly-Pottuz, C. Matta, M. I. de Barros Bouchet, et al.
Journal of Applied Physics 102 (6) 064912 (2007)
DOI: 10.1063/1.2779256
See this article

ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY

Wilfried Sigle
Annual Review of Materials Research 35 (1) 239 (2005)
DOI: 10.1146/annurev.matsci.35.102303.091623
See this article

Transmission Electron Microscopy

Paul Thomas and Paul Midgley
Transmission Electron Microscopy 377 (2016)
DOI: 10.1007/978-3-319-26651-0_13
See this article

Automated spatial drift correction for EFTEM image series

Bernhard Schaffer, Werner Grogger and Gerald Kothleitner
Ultramicroscopy 102 (1) 27 (2004)
DOI: 10.1016/j.ultramic.2004.08.003
See this article

Adhesion-related glycocalyx study: quantitative approach with imaging-spectrum in the energy filtering transmission electron microscope (EFTEM)

Mireille Soler, Sophie Desplat-Jego, Béatrice Vacher, et al.
FEBS Letters 429 (1) 89 (1998)
DOI: 10.1016/S0014-5793(98)00570-5
See this article

The SmartEFTEM-SI method: Development of a new spectrum-imaging acquisition scheme for quantitative mapping by energy-filtering transmission electron microscopy

Masashi Watanabe and Frances I. Allen
Ultramicroscopy 113 106 (2012)
DOI: 10.1016/j.ultramic.2011.10.014
See this article

Iodine insertion in high-Tc cuprates Raman, magnetization, X-ray photoelectron and electron energy loss measurements

Eric Faulques, Phillipe Molinié, Paul Berdahl, Thien Phap Nguyen and Jean-Louis Mansot
Physica C: Superconductivity 219 (3-4) 297 (1994)
DOI: 10.1016/0921-4534(94)90382-4
See this article

Study of the tribologically transformed structure created during fretting tests

E Sauger, L Ponsonnet, J.M Martin and L Vincent
Tribology International 33 (11) 743 (2000)
DOI: 10.1016/S0301-679X(00)00088-8
See this article

Use of a mass-thickness marker to estimate systematic errors and statistical noise in the detection of phosphorus by electron spectroscopic imaging

K Richter, A Haking, H Troester, et al.
Micron 28 (5) 407 (1997)
DOI: 10.1016/S0968-4328(97)00049-8
See this article

Plasmon energy mapping in energy-filtering transmission electron microscopy

W. Sigle, S. Krämer, V. Varshney, et al.
Ultramicroscopy 96 (3-4) 565 (2003)
DOI: 10.1016/S0304-3991(03)00117-7
See this article

Tribologically transformed structure in fretting

E Sauger, S Fouvry, L Ponsonnet, et al.
Wear 245 (1-2) 39 (2000)
DOI: 10.1016/S0043-1648(00)00464-6
See this article

Energy-filtered transmission electron microscopy: an overview

J. Verbeeck, D. Van Dyck and G. Van Tendeloo
Spectrochimica Acta Part B: Atomic Spectroscopy 59 (10-11) 1529 (2004)
DOI: 10.1016/j.sab.2004.03.020
See this article

Acquisition of the EELS data cube by tomographic reconstruction

W. Van den Broek, J. Verbeeck, S. De Backer, P. Scheunders and D. Schryvers
Ultramicroscopy 106 (4-5) 269 (2006)
DOI: 10.1016/j.ultramic.2005.09.001
See this article

Exploring different inelastic projection mechanisms for electron tomography

B. Goris, S. Bals, W. Van den Broek, J. Verbeeck and G. Van Tendeloo
Ultramicroscopy 111 (8) 1262 (2011)
DOI: 10.1016/j.ultramic.2011.02.007
See this article

Principles of Electron Optics

Principles of Electron Optics 1775 (1996)
DOI: 10.1016/B978-012333340-7/50264-7
See this article

Application of recording and processing of energy-filtered image sequences for the elemental mapping of biological specimens: Imaging-Spectrum

J.-L. LAVERGNE, C. FOA, P. BONGRAND, D. SEUX and J.-M. MARTIN
Journal of Microscopy 174 (3) 195 (1994)
DOI: 10.1111/j.1365-2818.1994.tb03467.x
See this article

Elemental occurrence maps: a starting point for quantitative EELS spectrum image processing

Gerald Kothleitner and Ferdinand Hofer
Ultramicroscopy 96 (3-4) 491 (2003)
DOI: 10.1016/S0304-3991(03)00111-6
See this article

Chemical mapping of a block copolymer electrolyte by low-loss EFTEM spectrum-imaging and principal component analysis

F.I. Allen, M. Watanabe, Z. Lee, N.P. Balsara and A.M. Minor
Ultramicroscopy 111 (3) 239 (2011)
DOI: 10.1016/j.ultramic.2010.11.035
See this article

Advances in Imaging and Electron Physics

W. Mark Rainforth
Advances in Imaging and Electron Physics 132 167 (2004)
DOI: 10.1016/S1076-5670(04)32004-5
See this article

Tomographic spectroscopic imaging; an experimental proof of concept

W. Van den Broek, J. Verbeeck, D. Schryvers, S. De Backer and P. Scheunders
Ultramicroscopy 109 (4) 296 (2009)
DOI: 10.1016/j.ultramic.2008.11.022
See this article

From a physicist's toy to an indispensable analytical tool in many fields of science

Christian Colliex
Ultramicroscopy 180 14 (2017)
DOI: 10.1016/j.ultramic.2016.11.007
See this article

Electron energy loss spectrometry mapping

Christian Colliex, Marcel Tenc�, Elisabeth Lef�vre, et al.
Mikrochimica Acta 114-115 (1) 71 (1994)
DOI: 10.1007/BF01244534
See this article

Energy filtering transmission electron microscopy and atomistic simulations of tribo-induced hybridization change of nanocrystalline diamond coating

M.I. De Barros Bouchet, C. Matta, B. Vacher, et al.
Carbon 87 317 (2015)
DOI: 10.1016/j.carbon.2015.02.041
See this article

Handbook of Microscopy for Nanotechnology

Christian Colliex and Odile StÈphan
Handbook of Microscopy for Nanotechnology 653 (2005)
DOI: 10.1007/1-4020-8006-9_21
See this article

Subcellular localization of boron in cultured melanoma cells by electron energy-loss spectroscopy of freeze-dried cryosections

J. Michel, W. Sauerwein, A. Wittig, G. Balossier and K. Zierold
Journal of Microscopy 210 (1) 25 (2003)
DOI: 10.1046/j.1365-2818.2003.01172.x
See this article

Electron Energy-Loss Spectroscopy in the Electron Microscope

R.F. Egerton
Electron Energy-Loss Spectroscopy in the Electron Microscope 29 (2011)
DOI: 10.1007/978-1-4419-9583-4_2
See this article

Electron Microscopy of Nanotubes

T. Stöckli
Electron Microscopy of Nanotubes 121 (2003)
DOI: 10.1007/978-1-4615-0315-6_5
See this article

Investigation of irradiated metal of WWER-type reactor internals after 45 years of operation. Part 3. Microstructure and phase composition

E. A. Kuleshova, S. V. Fedotova, B. A. Gurovich, et al.
Voprosy Materialovedeniya (3(103)) 157 (2020)
DOI: 10.22349/1994-6716-2020-103-3-157-180
See this article

Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrix

Rosine Coq Germanicus, Yoan Bourlier, Vincent Notot, et al.
Applied Surface Science 510 145522 (2020)
DOI: 10.1016/j.apsusc.2020.145522
See this article

Microstructure degradation of austenitic stainless steels after 45 years of operation as VVER-440 reactor internals

E.A. Kuleshova, S.V. Fedotova, B.A. Gurovich, et al.
Journal of Nuclear Materials 533 152124 (2020)
DOI: 10.1016/j.jnucmat.2020.152124
See this article

Characterisation of Li in the surface film of a corrosion resistant Mg-Li(-Al-Y-Zr) alloy

Y. Yan, Y. Qiu, O. Gharbi, N. Birbilis and P.N.H. Nakashima
Applied Surface Science 494 1066 (2019)
DOI: 10.1016/j.apsusc.2019.07.167
See this article

New techniques in electron energy-loss spectroscopy and energy-filtered imaging

R.F. Egerton
Micron 34 (3-5) 127 (2003)
DOI: 10.1016/S0968-4328(03)00023-4
See this article

Springer Handbook of Microscopy

Gianluigi Botton and Sagar Prabhudev
Springer Handbooks, Springer Handbook of Microscopy 345 (2019)
DOI: 10.1007/978-3-030-00069-1_7
See this article

Elemental mapping of labelled biological specimens at intermediate energy loss in an energy‐filtered TEM acquired using a direct detection device

Ranjan Ramachandra, Mason R. Mackey, Junru Hu, Steven T. Peltier, Nguyen‐Huu Xuong, Mark H. Ellisman and Stephen R. Adams
Journal of Microscopy 283 (2) 127 (2021)
DOI: 10.1111/jmi.13014
See this article

Ranjan Ramachandra, Mason R. Mackey, Junru Hu, Steven T. Peltier, Nguyen-Huu Xuong, Mark H. Ellisman and Stephen R. Adams
(2020)
DOI: 10.1101/2020.11.02.365940
See this article

Comparison of Techniques for EELS Mapping in Biology

R.D. Leapman and S.B. Andrews
Proceedings, annual meeting, Electron Microscopy Society of America 54 300 (1996)
DOI: 10.1017/S0424820100163964
See this article

Jie Zhu, Yi Qiang Shen and Si Ping Zhao
86 (2016)
DOI: 10.1109/IPFA.2016.7564254
See this article

From early to present and future achievements of EELS in the TEM

Christian Colliex
The European Physical Journal Applied Physics 97 38 (2022)
DOI: 10.1051/epjap/2022220012
See this article