The Citing articles tool gives a list of articles citing the current article. The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Optoelectronic and structural characterization of trapezoidal defects in 4H-SiC epilayers and the effect on MOSFET reliability
Sami A. El Hageali, Harvey Guthrey, Steven Johnston, Andrew Norman, Jake Soto, Bruce Odekirk, Robert E. Stahlbush, Nadeemullah A. Mahadik, Brian P. Gorman and Mowafak Al-Jassim Journal of Applied Physics 134(7) (2023) https://doi.org/10.1063/5.0153103
Nondestructive microstructural investigation of defects in 4H-SiC epilayers using a multiscale luminescence analysis approach
Sami A. El Hageali, Harvey Guthrey, Steven Johnston, Jake Soto, Bruce Odekirk, Brian P. Gorman and Mowafak Al-Jassim Journal of Applied Physics 131(18) (2022) https://doi.org/10.1063/5.0088313
Defect engineering in SiC technology for high-voltage power devices
Review Article: Case studies in future trends of computational and experimental nanomechanics
William Gerberich, Ellad B. Tadmor, Jeffrey Kysar, Jonathan A. Zimmerman, Andrew M. Minor, Izabela Szlufarska, Jonathan Amodeo, Benoit Devincre, Eric Hintsala and Roberto Ballarini Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 35(6) (2017) https://doi.org/10.1116/1.5003378
Theoretical investigation of the formation of basal plane stacking faults in heavily nitrogen-doped 4H-SiC crystals
William W. Gerberich, Roberto Ballarini, Eric D. Hintsala, Maneesh Mishra, Jean‐Francois Molinari, Izabela Szlufarska and D. J. Green Journal of the American Ceramic Society 98(9) 2681 (2015) https://doi.org/10.1111/jace.13753
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices