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Electromigration in layered Al lines studied by in-situ ultra-high voltage electron microscopy

H. Mori, H. Okabayashi and M. Komatsu
Thin Solid Films 300 (1-2) 25 (1997)
DOI: 10.1016/S0040-6090(96)09517-X
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Encyclopedia of Materials: Science and Technology

D. Caillard and A. Couret
Encyclopedia of Materials: Science and Technology 1 (2006)
DOI: 10.1016/B0-08-043152-6/02063-5
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