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This article has been cited by the following article(s):

Molecular Imaging and Local Density of States Characterization at the Si(111)/NaOH Interface

P. Allongue
Physical Review Letters 77 (10) 1986 (1996)
DOI: 10.1103/PhysRevLett.77.1986
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Etching pits and dislocations in Si{111}

A.J Nijdam, J.G.E Gardeniers, C Gui and M Elwenspoek
Sensors and Actuators A: Physical 86 (3) 238 (2000)
DOI: 10.1016/S0924-4247(00)00458-1
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Digital computation and in situ STM approach of silicon anisotropic etching

Jérôme Kasparian, M. Elwenspoek and Philippe Allongue
Surface Science 388 (1-3) 50 (1997)
DOI: 10.1016/S0039-6028(97)00356-7
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Stationary hillocks on etching silicon

M Elwenspoek
Journal of Micromechanics and Microengineering 9 (2) 180 (1999)
DOI: 10.1088/0960-1317/9/2/319
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Advances in Electrochemical Science and Engineering

Philippe Allongue
Advances in Electrochemical Sciences and Engineering, Advances in Electrochemical Science and Engineering 4 1 (1995)
DOI: 10.1002/9783527616787.ch1
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