Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

Quantification issues in ToF-SSIMS and AFM co-analysis in two-phase systems, exampled by a polymer blend

I. S. Gilmore, M. P. Seah and J. E. Johnstone
Surface and Interface Analysis 35 (11) 888 (2003)
DOI: 10.1002/sia.1616
See this article

Relationship between surface and bulk morphologies for immiscible polymer blends

G. Verfaillie, J. Devaux and R. Legras
Polymer 40 (11) 2929 (1999)
DOI: 10.1016/S0032-3861(98)00336-X
See this article

Surface quantitative characterization of poly(styrene-co-4-vinyl phenol)/poly(styrene-co-4-vinyl pyridine) blends with controlled hydrogen bonding interactions

Shiyong Liu, Chi- Ming Chan, Lu-Tao Weng and Ming Jiang
Polymer 45 (14) 4945 (2004)
DOI: 10.1016/j.polymer.2004.04.053
See this article

Mass Spectrometry in Polymer Chemistry

Christine M. Mahoney and Steffen M. Weidner
Mass Spectrometry in Polymer Chemistry 149 (2012)
DOI: 10.1002/9783527641826.ch6
See this article

Interest of silver and gold metallization for molecular SIMS and SIMS imaging

A. Delcorte and P. Bertrand
Applied Surface Science 231-232 250 (2004)
DOI: 10.1016/j.apsusc.2004.03.029
See this article

Adhesion Aspects of Thin Films, volume 2

A Delcorte, S Befahy, C Poleunis, M Troosters and P Bertrand
Adhesion Aspects of Thin Films, volume 2 155 (2005)
DOI: 10.1201/b12250-15
See this article

Defect analysis of Cl2/HBr/He/O2 etching process by imaging time-of-flight secondary ion mass spectrometry

Jin Zhao, D. Fraser Reich, Thien T. Nguyen, Larry Zhao and Tim Z. Hossain
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 18 (1) 207 (2000)
DOI: 10.1116/1.582137
See this article

Atomic force microscopy imaging of viscoelastic properties in toughened polypropylene resins

Bernard Nysten, Roger Legras and Jean‐Louis Costa
Journal of Applied Physics 78 (10) 5953 (1995)
DOI: 10.1063/1.360691
See this article

Quantitative approach towards the measurement of polypropylene/(ethylene-propylene) copolymer blends surface elastic properties by AFM

Eric Tomasetti, Roger Legras and Bernard Nysten
Nanotechnology 9 (4) 305 (1998)
DOI: 10.1088/0957-4484/9/4/001
See this article

Static secondary ion mass spectrometry (S-SIMS) Part 2: material science applications

Annemie Adriaens, Luc Van Vaeck and Freddy Adams
Mass Spectrometry Reviews 18 (1) 48 (1999)
DOI: 10.1002/(SICI)1098-2787(1999)18:1<48::AID-MAS2>3.0.CO;2-I
See this article

Combined XPS and ToF-SIMS study of miscible polymer blend surfaces: polystyrene/poly(2,6-dimethyl-1,4-phenylene oxide) (PS/PDMPO)

X. Vanden Eynde and P. Bertrand
Surface and Interface Analysis 27 (3) 157 (1999)
DOI: 10.1002/(SICI)1096-9918(199903)27:3<157::AID-SIA495>3.0.CO;2-L
See this article

Microbeam and Nanobeam Analysis

Patrick Bertrand and Weng Lu-Tao
Microbeam and Nanobeam Analysis 167 (1996)
DOI: 10.1007/978-3-7091-6555-3_8
See this article

Computational Atomistic Modeling in Carbon Flatland and Other 2D Nanomaterials

Aurélie Champagne, Samuel Dechamps, Simon M.-M. Dubois, et al.
Applied Sciences 10 (5) 1724 (2020)
DOI: 10.3390/app10051724
See this article