Articles citing this article

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Cited article:

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Valeria Chiono, Emiliano Descrovi, Susanna Sartori, et al.
NanoScience and Technology, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 645 (2011)
https://doi.org/10.1007/978-3-642-10497-8_22

A study of a differential method for a field diffracted by a rough surface

Boutaleb Habib, Salomon Laurent, Bassou Ghaouti and Chekroun Mohamed Zoheir
Journal of Molecular Structure: THEOCHEM 777 (1-3) 139 (2006)
https://doi.org/10.1016/j.theochem.2006.08.042

Wavelet analysis of near-field data and the resolution problem

D. Barchiesi and T. Gharbi
The European Physical Journal Applied Physics 5 (3) 297 (1999)
https://doi.org/10.1051/epjap:1999142

Computing the optical near-field distributions around complex subwavelength surface structures: A comparative study of different methods

Dominique Barchiesi, Christian Girard, Olivier J. F. Martin, Daniel Van Labeke and Daniel Courjon
Physical Review E 54 (4) 4285 (1996)
https://doi.org/10.1103/PhysRevE.54.4285

Dielectric versus topographic contrast in near-field microscopy

Olivier J. F. Martin, Christian Girard and Alain Dereux
Journal of the Optical Society of America A 13 (9) 1801 (1996)
https://doi.org/10.1364/JOSAA.13.001801

Influence of dielectric contrast and topography on the near field scattered by an inhomogeneous surface

Rémi Carminati and Jean-Jacques Greffet
Journal of the Optical Society of America A 12 (12) 2716 (1995)
https://doi.org/10.1364/JOSAA.12.002716

The inverse scanning tunneling near-field microscope (ISTOM) or tunnel scanning near-field optical microscope (TSNOM) 3D simulations and application to nano-sources

Dominique Barchiesi and Daniel Van Labeke
Ultramicroscopy 61 (1-4) 17 (1995)
https://doi.org/10.1016/0304-3991(95)00096-8