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Cited article:
Jacques Cazaux
Microsc. Microanal. Microstruct., 6 3 (1995) 345-362
This article has been cited by the following article(s):
24 articles
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Effective approaches for realizing quantitative analyses and high lateral resolution images on highly insulating samples by Auger electron spectroscopy
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Calculated effects of work function changes on the dispersion of secondary electron emission data: Application for Al and Si and related elements
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