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Cited article:
Peter Rez, Jon Karl Weiss, Douglas L. Medlin, David G. Howitt
Microsc. Microanal. Microstruct., 6 4 (1995) 433-440
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Progress in the Preparation of Cross-Sectional TEM Specimens by Ion-Beam Thinning
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Zeitschrift für Metallkunde 94 (3) 290 (2003)
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Mapping titanium and tin oxide phases using EELS: An application of independent component analysis
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Ultramicroscopy 111 (2) 169 (2011)
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Can fresnoite (Ba2TiSi2O8) incorporate Ti3+when crystallizing from highly reduced melts?
Thomas Höche, Hans-Joachim Kleebe and Rik Brydson
Philosophical Magazine A 81 (4) 825 (2001)
DOI: 10.1080/01418610151133258
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The Ti to TiO and TiO to Anatase Transformations Induced by Anodizing and Annealing Treatments of Ti Thin Film
Yu-Lin Chung, Der-Shin Gan and Keng-Liang Ou
Journal of The Electrochemical Society 159 (3) C133 (2012)
DOI: 10.1149/2.097203jes
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Study of the TiO to Anatase Transformation by Thermal Oxidation of Ti Film in Air
Chung-Ho Kao, Sung-Wei Yeh, Hsing-Lu Huang, Dershin Gan and Pouyan Shen
The Journal of Physical Chemistry C 115 (13) 5648 (2011)
DOI: 10.1021/jp109082g
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Correlation between deposition parameters of periodic titanium metal/oxide nanometric multilayers and their chemical and structural properties investigated by STEM-EELS
Valérie Potin, Arnaud Cacucci and Nicolas Martin
Micron 101 62 (2017)
DOI: 10.1016/j.micron.2017.06.008
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Advances in EELS spectroscopy by using new detector and new specimen preparation technologies
C. Scheu, M. Gao, K. Van Benthem, et al.
Journal of Microscopy 210 (1) 16 (2003)
DOI: 10.1046/j.1365-2818.2003.01181.x
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