Articles citing this article

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Cited article:

Nanostructured Semiconductors

Isabelle Berbezier, Antoine Ronda, Jean-Noël Aqua, Luc Favre and Thomas Frisch
Nanostructured Semiconductors 165 (2014)
https://doi.org/10.1201/b15634-6

Distortion Measurement of Multi-Finger Transistor Using Split Higher-Order Laue Zone Lines Analysis

Fumihiko Uesugi, Takashi Yamazaki, Koji Kuramochi, Iwao Hashimoto, Kenji Kojima and Shiro Takeno
Japanese Journal of Applied Physics 47 (5R) 3709 (2008)
https://doi.org/10.1143/JJAP.47.3709

Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers

F. Houdellier, C. Roucau, L. Clément, J.L. Rouvière and M.J. Casanove
Ultramicroscopy 106 (10) 951 (2006)
https://doi.org/10.1016/j.ultramic.2006.04.011

Elastic Strain Relaxation in Si1-xGex Layers Epitaxially Grown on Si Substrates

I. Berbezier, B. Gallas and J. Derrien
Surface Review and Letters 05 (01) 133 (1998)
https://doi.org/10.1142/S0218625X98000268