The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
Aldo Armigliato, Roberto Balboni, Franco Corticelli, Stefano Frabboni
Microsc. Microanal. Microstruct., 6 5-6 (1995) 449-456
This article has been cited by the following article(s):
Elvio Carlino
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Phase Transitions 81 (7-8) 751 (2008)
DOI: 10.1080/01411590802130576
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Dependence of SiGe growth instability on Si substrate orientation
I. Berbezier, B. Gallas, A. Ronda and J. Derrien
Surface Science 412-413 415 (1998)
DOI: 10.1016/S0039-6028(98)00461-0
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Elastic Strain Relaxation in Si1-xGex Layers Epitaxially Grown on Si Substrates
I. Berbezier, B. Gallas and J. Derrien
Surface Review and Letters 05 (01) 133 (1998)
DOI: 10.1142/S0218625X98000268
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Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers
F. Houdellier, C. Roucau, L. Clément, J.L. Rouvière and M.J. Casanove
Ultramicroscopy 106 (10) 951 (2006)
DOI: 10.1016/j.ultramic.2006.04.011
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Nanostructured Semiconductors
Isabelle Berbezier, Antoine Ronda, Jean-Noël Aqua, Luc Favre and Thomas Frisch
Nanostructured Semiconductors 165 (2014)
DOI: 10.1201/b15634-6
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Microscopy of Semiconducting Materials 2001
S Lavagne, C Levade and G Vanderschaeve
Microscopy of Semiconducting Materials 2001 219 (2018)
DOI: 10.1201/9781351074629-46
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SiGe nanostructures: new insights into growth processes
I Berbezier, A Ronda and A Portavoce
Journal of Physics: Condensed Matter 14 (35) 8283 (2002)
DOI: 10.1088/0953-8984/14/35/306
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Distortion Measurement of Multi-Finger Transistor Using Split Higher-Order Laue Zone Lines Analysis
Fumihiko Uesugi, Takashi Yamazaki, Koji Kuramochi, et al.
Japanese Journal of Applied Physics 47 (5) 3709 (2008)
DOI: 10.1143/JJAP.47.3709
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