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Cited article:

Spatial Resolution Optimization of Backscattered Electron Images Using Monte Carlo Simulation

Camille Probst, Hendrix Demers and Raynald Gauvin
Microscopy and Microanalysis 18 (3) 628 (2012)

Electronic contribution to secondary electron compositional contrast in the scanning electron microscope

Martin R. Castell, Doug D. Perovic and Hugues Lafontaine
Ultramicroscopy 69 (4) 279 (1997)

Comparison of spatial resolutions obtained with different signal components in scanning electron microscopy

P.G. Merli, A. Migliori, M. Nacucchi and M. Vittori Antisari
Ultramicroscopy 65 (1-2) 23 (1996)