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Cited article:

Resolution of Semiconductor Multilayers using Backscattered Electrons in Scanning Electron Microscopy

Donato Govoni, Pier Giorgio Merli, Andrea Migliori, Michele Nacucchi

Microsc. Microanal. Microstruct., 6 5-6 (1995) 499-504

DOI: https://doi.org/10.1051/mmm:1995141

This article has been cited by the following article(s):

Spatial Resolution Optimization of Backscattered Electron Images Using Monte Carlo Simulation

Camille Probst, Hendrix Demers and Raynald Gauvin
Microscopy and Microanalysis 18 (3) 628 (2012)
https://doi.org/10.1017/S1431927612000207

Electronic contribution to secondary electron compositional contrast in the scanning electron microscope

Martin R. Castell, Doug D. Perovic and Hugues Lafontaine
Ultramicroscopy 69 (4) 279 (1997)
https://doi.org/10.1016/S0304-3991(97)00051-X

Comparison of spatial resolutions obtained with different signal components in scanning electron microscopy

P.G. Merli, A. Migliori, M. Nacucchi and M. Vittori Antisari
Ultramicroscopy 65 (1-2) 23 (1996)
https://doi.org/10.1016/S0304-3991(96)00053-8