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Cited article:
Jiang Hua Chen, Marc Op de Beeck, Dirk Van Dyck
Microsc. Microanal. Microstruct., 7 1 (1996) 27-47
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Present developments in high-resolution transmission electron microscopy
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Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging
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ToTEM: A software for fast TEM image simulation
P. J. Yuan, K. P. Wu, S. W. Chen, D. L. Zhang, C. H. Jin, Y. Yao and F. Lin
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