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Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

I. Sobchenko, J. Pesicka, D. Baither, et al.
Philosophical Magazine 87 (17) 2427 (2007)
DOI: 10.1080/14786430701203184
See this article