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Cited article:

Quantification de l'analyse en profondeur par spectrométrie d'électrons Auger et pulvérisation ionique : caractérisation des interfaces des films multicouches Cu–Co
Quantification of AES depth sputter profiling: characterization of Cu–Co multilayers interfaces

Françoise Basile, Jean Bergner, Claude Bombart, Pascale Nallet, Elisabeth Chassaing, Gérard Lorang

Microsc. Microanal. Microstruct., 8 4-5 (1997) 301-314

DOI: https://doi.org/10.1051/mmm:1997123

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