TEM observations of SiC-SiC materials with a carbon interphase after tests at high temperature Jean Vicens, Marie-Hélène Rouillon, Pascal Fourvel, François Abbé, Moussa Gomina and Jean-Louis ChermantMicrosc. Microanal. Microstruct., 2 1 (1991) 75-85DOI: https://doi.org/10.1051/mmm:019910020107500