In Situ EELS and TEM Observation of Boron Carbide During Hydrogen- and Helium-Ion Bombardments Kouhei N. Kushita, Kiichi Hojou and Shigemi FurunoMicrosc. Microanal. Microstruct., 6 1 (1995) 149-157DOI: https://doi.org/10.1051/mmm:1995115