Influence of Imaging Parameters and Specimen Thinning on Strain Measurements in Au/Ni MBE Multilayers by HREM Image Processing Pascale Bayle-Guillemaud and Jany ThibaultMicrosc. Microanal. Microstruct., 8 2 (1997) 125-135DOI: https://doi.org/10.1051/mmm:1997111