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Application of the Convergent Beam Imaging (CBIM) Technique to the Analysis of Crystal Defects

Jean-Paul Morniroli, Patrick Cordier, Éric Van Cappellen, Jin Min Zuo and John Spence

Microsc. Microanal. Microstruct., 8 3 (1997) 187-202

DOI: https://doi.org/10.1051/mmm:1997114

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