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Cross-sectional electron microscopy investigation of silicon amorphisation during high temperature zinc-ion bombardment

Joël Faure, Stephan Simov, Maria Kalitzova, Gérard Balossier, Lalit-Mohan Bharadwaj, Alain Claverie and Pierre Bonhomme

Microsc. Microanal. Microstruct., 1 2 (1990) 141-148

DOI: https://doi.org/10.1051/mmm:0199000102014100

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