Microscopy Microanalysis Microstructures

Two remarkable defect related electron diffraction effects

Marc Verwerft, Wout Luyten and Severin Amelinckx

Microsc. Microanal. Microstruct., 1 3 (1990) 167-173

DOI: 10.1051/mmm:0199000103016700

Marc Verwerft

Wout Luyten

Severin Amelinckx

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)